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1

[IEEE 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Singapore, Singapore (2019.3.12-2019.3.15)] 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - TCAD Analysis of Source-Side Injection Program of FinFET Split-Gate MONOS

Sonoda, Kenichiro, Tsukuda, Eiji, Tsuda, Shibun, Hayashi, Tomohiro, Akiyama, Yutaka, Yamaguchi, Yasuo, Yamashita, Tomohiro

Year:

2019

Language:

english

File:

PDF, 132 KB

english, 2019

2

bilayer quantum Hall phases investigated by magnetotransport methods

Zheng, Yangdong, Sawada, Anju, Ezawa, Zyun F., Morikawa, Tomoki, Fukuda, Akira, Terasawa, Daiju, Tsuda, Shibun, Nguyen, Minh-Hai

Journal:

Physical Review B

Year:

2011

Language:

english

File:

PDF, 391 KB

english, 2011

3

quantum Hall states

Nguyen, Minh-Hai, Tsuda, Shibun, Terasawa, Daiju, Fukuda, Akira, Zheng, Yangdong, Sawada, Anju

Journal:

Physical Review B

Year:

2014

Language:

english

File:

PDF, 602 KB

english, 2014

4

Resistance Peak Shift and Deviated Hall Plateau Driven by Dynamic Nuclear Polarization in Fractional Quantum Hall States

Tsuda, Shibun, Mitani, Shohei, Nguyen, Minh-Hai, Terasawa, Daiju, Fukuda, Akira, Sawada, Anju

Journal:

Journal of the Physical Society of Japan

Year:

2019

Language:

english

File:

PDF, 566 KB

english, 2019

5

quantum Hall state

Tsuda, Shibun, Nguyen, Minh-Hai, Terasawa, Daiju, Fukuda, Akira, Sawada, Anju

Journal:

Physical Review B

Year:

2016

Language:

english

File:

PDF, 757 KB

english, 2016

6

[IEEE 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2018.10.15-2018.10.18)] 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - The study of Plasma Induced Damage on Silicon on Thin BOX

Yamamoto, Yoshiki, Segi, Kazuhiko, Tsuda, Shibun, Makiyama, Hideki, Hasegawa, Takumi, Maekawa, Keiichi, Shinkawata, Hiroki, Yamashita, Tomohiro

Year:

2018

File:

PDF, 74 KB

2018

7

The study of Plasma Induced Damage on 65nm Silicon on Thin BOX transistor

Yamamoto, Yoshiki, Segi, Kazuhiko, Tsuda, Shibun, Makiyama, Hideki, Hasegawa, Takumi, Maekawa, Keiichi, Shinkawata, Hiroki, Yamashita, Tomohiro

Journal:

IEEE Journal of the Electron Devices Society

Year:

2019

File:

PDF, 301 KB

2019

8

Revisited study of fluorine implantation impact on negative bias temperature instability for input/output device of automotive micro controller unit

Yoshida, Tetsuya, Maekawa, Keiichi, Tsuda, Shibun, Shimizu, Tatsuo, Ogasawara, Makoto, Aono, Hideki, Yamaguchi, Yasuo

Journal:

Japanese Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 2.29 MB

english, 2018

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